Quality Assurance & Testing
TAO Run DEFT OD AOI
Run a binary industrial-inspection DEFT loop with TAO RT-DETR: measure on frozen KPI/test roles, mine gap-similar real and clean images with SigLIP, accumulate admitted COCO data, retrain from one base checkpoint, and select by KPI AP50. Use for iterative AOI defect detection, not generic multiclass OD.
- Publisher / source
- NVIDIA Skills (Verified)
- Upstream record
- NVIDIA/skills
- Version
- Version 2
- Published
- Publication review
- Approved for publication
- Content fingerprint
b24a19b5ee803180546949b3beafa0c9b7960c08946a20bb0f09db329d27bd7e